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uv vis diffuse reflectance spectrophotometer  (JASCO Inc)


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    Structured Review

    JASCO Inc uv vis diffuse reflectance spectrophotometer
    ( a ) <t>UV–Vis</t> absorbance; ( b ) (αhν) 2 versus hν plots of SFO, NiO, and SFO/NiO photocatalysts.
    Uv Vis Diffuse Reflectance Spectrophotometer, supplied by JASCO Inc, used in various techniques. Bioz Stars score: 95/100, based on 351 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/result/uv vis diffuse reflectance spectrophotometer/product/JASCO Inc
    Average 95 stars, based on 351 article reviews
    uv vis diffuse reflectance spectrophotometer - by Bioz Stars, 2026-06
    95/100 stars

    Images

    1) Product Images from "Mechanistic and electrochemical investigation of solar light driven organic pollutant degradation using SrFe 12 O 19 /NiO Z-scheme heterojunctions"

    Article Title: Mechanistic and electrochemical investigation of solar light driven organic pollutant degradation using SrFe 12 O 19 /NiO Z-scheme heterojunctions

    Journal: Scientific Reports

    doi: 10.1038/s41598-026-39997-0

    ( a ) UV–Vis absorbance; ( b ) (αhν) 2 versus hν plots of SFO, NiO, and SFO/NiO photocatalysts.
    Figure Legend Snippet: ( a ) UV–Vis absorbance; ( b ) (αhν) 2 versus hν plots of SFO, NiO, and SFO/NiO photocatalysts.

    Techniques Used:



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    Image Search Results


    ( A ) UV-vis-NIR absorption spectra of 2D c-MOF films (self-assembled on glass-based substrates), with data normalized to the absorption peak in the NIR-II region. ( B ) Simulated absorption spectra of different molecular segments, including the small-conjugated, noncoordinated fragment without radicals (H-DAI); the small-conjugated, noncoordinated fragment with radicals (H-DAI-2H); the small-conjugated, coordinated fragment with radicals (Ni-2-H-DAI); the extended-conjugated, noncoordinated fragment without radicals (ligand, H-HATI); the extended-conjugated, noncoordinated fragment with radicals (H-HATI-2H); and the extended-conjugated and coordinated fragment with radicals (Ni-2-H-HATI). ( C ) Electron-hole distributions of H-CMOF (left) and Me-CMOF (right) corresponding to the NIR-II-related transition. ( D and E ) Effect of alkyl chains on electrostatic potential distribution (D) and molecular configuration (E) of 2D c-MOFs. ( F ) High-resolution XPS spectrum of Ni (2p) for 2D c-MOFs.

    Journal: Science Advances

    Article Title: Super-stable two-dimensional radical conjugated metal-organic frameworks for efficient NIR-II photothermal conversion

    doi: 10.1126/sciadv.aec7519

    Figure Lengend Snippet: ( A ) UV-vis-NIR absorption spectra of 2D c-MOF films (self-assembled on glass-based substrates), with data normalized to the absorption peak in the NIR-II region. ( B ) Simulated absorption spectra of different molecular segments, including the small-conjugated, noncoordinated fragment without radicals (H-DAI); the small-conjugated, noncoordinated fragment with radicals (H-DAI-2H); the small-conjugated, coordinated fragment with radicals (Ni-2-H-DAI); the extended-conjugated, noncoordinated fragment without radicals (ligand, H-HATI); the extended-conjugated, noncoordinated fragment with radicals (H-HATI-2H); and the extended-conjugated and coordinated fragment with radicals (Ni-2-H-HATI). ( C ) Electron-hole distributions of H-CMOF (left) and Me-CMOF (right) corresponding to the NIR-II-related transition. ( D and E ) Effect of alkyl chains on electrostatic potential distribution (D) and molecular configuration (E) of 2D c-MOFs. ( F ) High-resolution XPS spectrum of Ni (2p) for 2D c-MOFs.

    Article Snippet: The reflection spectra of 2D c-MOFs solid-state films were measured on a diffuse reflectance UV-vis-NIR absorption spectrometer (UH4150, Hitachi Co.) at the Renmin University of China Analysis Center (fig. S28A).

    Techniques:

    ( a ) UV–Vis absorbance; ( b ) (αhν) 2 versus hν plots of SFO, NiO, and SFO/NiO photocatalysts.

    Journal: Scientific Reports

    Article Title: Mechanistic and electrochemical investigation of solar light driven organic pollutant degradation using SrFe 12 O 19 /NiO Z-scheme heterojunctions

    doi: 10.1038/s41598-026-39997-0

    Figure Lengend Snippet: ( a ) UV–Vis absorbance; ( b ) (αhν) 2 versus hν plots of SFO, NiO, and SFO/NiO photocatalysts.

    Article Snippet: The optical properties and band gaps of the NMs were assessed using a UV-Vis diffuse reflectance spectrophotometer (UV-Vis DRS, JASCO, and Japan).The residual dye concentration was measured using a colorimetric method following the APHA guidelines.

    Techniques:

    (a) UV–vis diffuse-reflectance spectra of Al 2 O 3 , RuP (66 μmol g –1 )/Al 2 O 3 , and RuCP (66 μmol g –1 )/Al 2 O 3 , FT-IR spectra of (b) RuP (66 μmol g –1 )/Al 2 O 3 , and (c) RuCP (66 μmol g –1 )/Al 2 O 3 before and after irradiation (1.1 mW cm –2 ) at 400 nm for 1 h under a CO 2 atmosphere. The FT-IR spectra of the samples were recorded immediately after the suspended solids were collected by filtration and washed with diethyl ether several times. The measurements were completed within approximately 3 min after filtration.

    Journal: Journal of the American Chemical Society

    Article Title: Elucidating the Origin of Hidden Limitations in Ru-Complex/Ag/Polymeric Carbon Nitride Hybrid Photocatalysts for Visible-Light CO 2 Reduction

    doi: 10.1021/jacs.5c21374

    Figure Lengend Snippet: (a) UV–vis diffuse-reflectance spectra of Al 2 O 3 , RuP (66 μmol g –1 )/Al 2 O 3 , and RuCP (66 μmol g –1 )/Al 2 O 3 , FT-IR spectra of (b) RuP (66 μmol g –1 )/Al 2 O 3 , and (c) RuCP (66 μmol g –1 )/Al 2 O 3 before and after irradiation (1.1 mW cm –2 ) at 400 nm for 1 h under a CO 2 atmosphere. The FT-IR spectra of the samples were recorded immediately after the suspended solids were collected by filtration and washed with diethyl ether several times. The measurements were completed within approximately 3 min after filtration.

    Article Snippet: The prepared materials were characterized by nuclear magnetic resonance (NMR) (JEOL ECA400II) ( 1 H; 400 MHz and 31 P; 168 MHz), X-ray diffraction (XRD) (MiniFlex600, Rigaku; Cu–Kα radiation), UV–vis diffuse-reflectance spectroscopy (DRS) (V-565, Jasco), and Fourier transform infrared (FT-IR) spectroscopy (FT-IR-610, Jasco).

    Techniques: Irradiation, Filtration